HYPER-SENSIVITY: Combines Backside Illumination with TDI

VT Sense Series is based on TDI (time delayed integration) technology which increases sensitivity by accumulating signals across multiple lines synchronized in a time-delayed mode. VT Sense Series offers 256 times greater sensitivity with 256 stages and supports higher line rates up to 543 kHz. The series is well-suited for demanding applications including flat panel inspection, semiconductor inspection, and scientific imaging.

VT Sense Series BSI (back-side illuminated) TDI line scan sensors offer enhanced quantum efficiency (QE) and signal-to-noise ratio (SNR). BSI sensors allow for greater sensitivity and ensure superior image quality in visible, UV, and NIR imaging. With exceptional sensitivity, VT Sense Series demonstrates excellent performance in low-light environments.